The main goal of the design company is to develop chips according to market demand. In the whole design process, it is necessary to always consider the problems related to testing for the following reasons:
1) With the precision and miniaturization of consumer electronic products, the complexity of various ic chips has become higher, with more and more modules in the chips, more and more advanced manufacturing processes and more corresponding failure modes. How to test the whole chip completely and effectively is a problem that needs to be considered in the design process.
2)? Design, manufacturing and even testing itself will bring some failures. How to ensure that the designed chip reaches the design goal, how to ensure that the manufactured chip reaches the required yield, and how to ensure the quality and effectiveness of the test itself, so as to provide customers with products that meet product specifications and qualified quality, all of which require that the test scheme must be considered at the beginning of design.
3)? Cost considerations. The sooner the fault is found, the more unnecessary waste can be reduced; The higher the redundancy of design and manufacturing, the better the yield of final products; At the same time, if more meaningful test data can be obtained, it can in turn provide useful information to the design and manufacturing end, so that the latter can effectively analyze the failure mode and improve the design and manufacturing yield.